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dc.contributor.authorPiña Monarrez, Manuel Román
dc.date.accessioned2025-12-15T20:54:07Z
dc.date.available2025-12-15T20:54:07Z
dc.date.issued2025-08-12es_MX
dc.identifier.urihttps://cathi.uacj.mx/20.500.11961/32414
dc.description.abstractCommunication via optical fiber is increasingly being used in harsh applications where environmental vibration is present. This study involves a Weibull reliability analysis focused on the performance of fiber optic connectors when they are subjected to mechanical random vibration stress to simulate real-world operating conditions, and the insertion loss (IL) degradation is measurable. By analyzing the testing times and stress levels, the Weibull shape (𝛽) and scale (𝜂) parameters are estimated directly from the maximal and minimal principal IL stresses (𝜎1, 𝜎2), enabling the prediction of the connector’s reliability with efficiency. The sample size n is derived from the desired reliability (R(t)), and the GR-326 mechanical vibration test (2.306 Grms for six hours) is performed on optical SC angled physical contact (PC) polish fiber endface connectors that are monitored during testing to evaluate the IL transient change in the optical transmission. The method is verified by an experiment performed with 𝜎1 =0.3960 and 𝜎2 =0.1910 where the IL measurements are captured with an Agilent N7745A source-detector optical equipment, and the Weibull statistical results provide a connector’s reliability R(t) = 0.8474, with a characteristic value of 𝜂 = 0.2750 dB and 𝛽 = 3. Finally, the connector’s reliability is as worthy of attention as the telecommunication sign conditions.es_MX
dc.description.urihttps://www.mdpi.com/2571-631X/8/3/46es_MX
dc.language.isoen_USes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/mx/*
dc.subjectFiber optic connectorses_MX
dc.subjectWeibull distributiones_MX
dc.subjectrandom vibration stress-fatiguees_MX
dc.subjectreliabilityes_MX
dc.subjectSC angled PC connectorses_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleWeibull Reliability Based on Random Vibration Performance for Fiber Optic Connectorses_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista3es_MX
dcrupi.volumen8es_MX
dcrupi.nopagina2-15es_MX
dc.identifier.doihttps://doi.org/10.3390/vibration8030046es_MX
dc.contributor.coauthorHernandez Ramos, Maria Magdalena
dc.contributor.coauthorRamos, Secundino
dc.journal.titleApplied Scienceses_MX
dc.contributor.coauthorexternoBarraza Contreras, Jesús Manuel
dcrupi.colaboracionextMéxicoes_MX
dcrupi.pronacesNingunoes_MX


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