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Weibull Reliability Based on Random Vibration Performance for Fiber Optic Connectors
| dc.contributor.author | Piña Monarrez, Manuel Román | |
| dc.date.accessioned | 2025-12-15T20:54:07Z | |
| dc.date.available | 2025-12-15T20:54:07Z | |
| dc.date.issued | 2025-08-12 | es_MX |
| dc.identifier.uri | https://cathi.uacj.mx/20.500.11961/32414 | |
| dc.description.abstract | Communication via optical fiber is increasingly being used in harsh applications where environmental vibration is present. This study involves a Weibull reliability analysis focused on the performance of fiber optic connectors when they are subjected to mechanical random vibration stress to simulate real-world operating conditions, and the insertion loss (IL) degradation is measurable. By analyzing the testing times and stress levels, the Weibull shape (𝛽) and scale (𝜂) parameters are estimated directly from the maximal and minimal principal IL stresses (𝜎1, 𝜎2), enabling the prediction of the connector’s reliability with efficiency. The sample size n is derived from the desired reliability (R(t)), and the GR-326 mechanical vibration test (2.306 Grms for six hours) is performed on optical SC angled physical contact (PC) polish fiber endface connectors that are monitored during testing to evaluate the IL transient change in the optical transmission. The method is verified by an experiment performed with 𝜎1 =0.3960 and 𝜎2 =0.1910 where the IL measurements are captured with an Agilent N7745A source-detector optical equipment, and the Weibull statistical results provide a connector’s reliability R(t) = 0.8474, with a characteristic value of 𝜂 = 0.2750 dB and 𝛽 = 3. Finally, the connector’s reliability is as worthy of attention as the telecommunication sign conditions. | es_MX |
| dc.description.uri | https://www.mdpi.com/2571-631X/8/3/46 | es_MX |
| dc.language.iso | en_US | es_MX |
| dc.relation.ispartof | Producto de investigación IIT | es_MX |
| dc.relation.ispartof | Instituto de Ingeniería y Tecnología | es_MX |
| dc.rights | Atribución-NoComercial-SinDerivadas 2.5 México | * |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/2.5/mx/ | * |
| dc.subject | Fiber optic connectors | es_MX |
| dc.subject | Weibull distribution | es_MX |
| dc.subject | random vibration stress-fatigue | es_MX |
| dc.subject | reliability | es_MX |
| dc.subject | SC angled PC connectors | es_MX |
| dc.subject.other | info:eu-repo/classification/cti/7 | es_MX |
| dc.title | Weibull Reliability Based on Random Vibration Performance for Fiber Optic Connectors | es_MX |
| dc.type | Artículo | es_MX |
| dcterms.thumbnail | http://ri.uacj.mx/vufind/thumbnails/rupiiit.png | es_MX |
| dcrupi.instituto | Instituto de Ingeniería y Tecnología | es_MX |
| dcrupi.cosechable | Si | es_MX |
| dcrupi.norevista | 3 | es_MX |
| dcrupi.volumen | 8 | es_MX |
| dcrupi.nopagina | 2-15 | es_MX |
| dc.identifier.doi | https://doi.org/10.3390/vibration8030046 | es_MX |
| dc.contributor.coauthor | Hernandez Ramos, Maria Magdalena | |
| dc.contributor.coauthor | Ramos, Secundino | |
| dc.journal.title | Applied Sciences | es_MX |
| dc.contributor.coauthorexterno | Barraza Contreras, Jesús Manuel | |
| dcrupi.colaboracionext | México | es_MX |
| dcrupi.pronaces | Ninguno | es_MX |

