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dc.contributor.authorPiña Monarrez, Manuel Román
dc.date.accessioned2025-12-15T20:46:52Z
dc.date.available2025-12-15T20:46:52Z
dc.date.issued2024-02-21es_MX
dc.identifier.urihttps://cathi.uacj.mx/20.500.11961/32408
dc.description.abstractIn this paper, based on the Weibull Inverse Power Law, we present a methodology to determine the following: (1) the failure percentiles, referred to as the P–S–N field, of an S–N curve for a 42CrMo4 steel material exhibiting bilinear (𝑠1 and 𝑠2) behavior (e.g., a competence failure mode); (2) the Weibull family that characterizes the entire bilinear behavior; and (3) the zero-vibration test plan that meets the required vibration reliability index of 𝑅⁡(𝑡) =0.97 with a reliability confidence level of 𝐶⁢𝐿 =0.75. From the application, based on the formulated normal–Weibull relationship, we determine the failure percentiles for the normal (one, two, and three) sigma levels, as well as those failure percentiles corresponding to the capability (𝐶⁢𝑝) and ability (𝐶⁢𝑝⁢𝑘) indices. Finally, we present the formulation to determine the 𝑅⁡(𝑡) index and the 𝐶⁢𝐿 level associated with each normal percentile, along with their numerical values.es_MX
dc.description.urihttps://www.mdpi.com/2076-3417/15/5/2295es_MX
dc.language.isoen_USes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/mx/*
dc.subjectFatigue P-S-N fieldes_MX
dc.subjectWeibull/IPL modeles_MX
dc.subjectBilinear modeles_MX
dc.subjectReliability percentileses_MX
dc.subjectTesting planes_MX
dc.subjectCapability indiceses_MX
dc.subjectSix sigmaes_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleMethodology to Determine the Stress Distribution Based on Fatigue Data with Bilinear Behavior and Its P–S–N Field and Testing Planes_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista5es_MX
dcrupi.volumen15es_MX
dcrupi.nopagina2-11es_MX
dc.identifier.doihttps://doi.org/10.3390/app15052295es_MX
dc.contributor.coauthorHernandez Ramos, Maria Magdalena
dc.contributor.alumno228139es_MX
dc.journal.titleApplied Scienceses_MX
dc.contributor.coauthorexternoMonclova Quintana, Osvaldo
dc.contributor.coauthorexternoOrtiz Yañez, Jesús Francisco
dcrupi.colaboracionextMéxicoes_MX
dcrupi.pronacesNingunoes_MX


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