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dc.contributor.authorPiña Monarrez, Manuel Román
dc.date.accessioned2024-12-10T18:41:54Z
dc.date.available2024-12-10T18:41:54Z
dc.date.issued2024-09-25es_MX
dc.identifier.urihttps://cathi.uacj.mx/20.500.11961/29457
dc.description.abstractReliability prediction for electronic products is a fundamental activity for automotive industry for several reasons: 1) understanding if a reliability goal is met, 2) comparing among alternative designs, or 3) evaluating reliability improvements. Reliability prediction is defined by the computation of the failure rates of all electronic components that make up the system/product. In the automotive field there are several guides designed for reliability prediction of electronic components, where the Siemens SN 29500 is well accepted by automotive industry. However, the Siemens SN 29500 standard, as well as other standards, gives the basis for failure rate calculation assuming constant environmental conditions, but not a step-by-step process when products are operating under different environments during their field life. Thus, in this article we present a step-by-step process to fully understand the implementation of the Siemens SN 29500 standard, when environment is not constant, to obtain the failure rate/reliability value of a product following an automotive electronic applicationes_MX
dc.description.urihttps://revistas.unal.edu.co/index.php/dyna/article/view/114851es_MX
dc.language.isoen_USes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/mx/*
dc.subjectreliability predictiones_MX
dc.subjectfailure ratees_MX
dc.subjectSN 29500es_MX
dc.subjectmission profilees_MX
dc.subjectfailure in timees_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleReliability prediction for automotive electronicses_MX
dc.title.alternativePredicción de confiabilidad para electrónica automotrizes_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista233es_MX
dcrupi.volumen91es_MX
dcrupi.nopagina114-119es_MX
dc.identifier.doihttps://doi.org/10.15446/dyna.v91n233.114851es_MX
dc.contributor.alumno228139es_MX
dc.journal.titleDynaes_MX
dc.contributor.authorexternoOrtiz Yañez, Jesús Francisco
dcrupi.colaboracionextMéxicoes_MX
dcrupi.colaboracionextMéxicoes_MX
dcrupi.pronacesNingunoes_MX


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