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dc.date.accessioned2023-09-20T16:19:32Z
dc.date.available2023-09-20T16:19:32Z
dc.date.issued2023-03-30es_MX
dc.identifier.urihttp://cathi.uacj.mx/20.500.11961/25937
dc.description.abstractIn this paper, the formulation to incorporate the used vibration profile, the stress generated by the product’s application, mass, and the resonance frequency is given. After that, based on the vibration output data, the two-parameterWeibull distribution is used to predict the corresponding reliability indices. In the method, the mentioned stress is incorporated as acceleration response (Ares), and by using a dynamic stress factor (sdyn). In addition, the Weibull parameters are determined based on the generated maximum and minimum principal vibration stress values. In the paper we show the efficiency of the fitted Weibull distribution to predict the reliability indices, by using its Weibull shape and scale parameters, it is always possible to reproduce the principal vibration stress values. Additionally, from the numerical application, we show how to use theWeibull analysis to determine the reliability index for a desired stress or desired cycle value. Finally, we also present the guidelines to apply the proposed method to any vibration fatigue analysis where the Ares (used to determine the s1 and s2 values), and the sdyn value are both known.es_MX
dc.description.urihttps://www.mdpi.com/2076-3417/13/7/4403es_MX
dc.language.isoen_USes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/mx/*
dc.subjectfatigue damagees_MX
dc.subjectrandom vibrationes_MX
dc.subjectWeibull distributiones_MX
dc.subjectfatigue reliability analysises_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleVibration Fatigue Life Reliability Cable Trough Assessment by Using Weibull Distributiones_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista7es_MX
dcrupi.volumen13es_MX
dcrupi.nopagina2-15es_MX
dc.identifier.doihttps://doi.org/10.3390/app13074403es_MX
dc.contributor.coauthorPiña Monarrez, Manuel Román
dc.contributor.alumno187061es_MX
dc.journal.titleApplied Scienceses_MX
dc.contributor.authorexternoBarraza-Contreras, Jesús Manuel
dc.contributor.coauthorexternoVilla-Señor, Roberto C.
dcrupi.pronacesNingunoes_MX


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