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AutorRodriguez Picon, Luis Alberto
Accedido2023-08-09T16:56:28Z
Disponible2023-08-09T16:56:28Z
Fecha de publicación2023-01-08es_MX
Identificador de objeto (URI)http://cathi.uacj.mx/20.500.11961/25806
Resumen/AbstractThe stochastic modeling of performance characteristics is an important approach for the quality assessment of products. As part of the stochastic modeling, it is possible to consider different variation sources such as temporal, unit-to-unit heterogeneity and measurement error. These sources have been incorporated into different stochastic processes in the literature. Considering the unit-to-unit heterogeneity, two sources of variation can be found for certain products, particularly when the initial level and the critical threshold vary from unit-to-unit. Although, these sources have been studied separately, they have not been studied simultaneously. In this paper, a modeling approach is proposed which considers the gamma process to take into account the temporal uncertainty and the initial degradation level and the critical threshold level as two additional sources of variation. The modeling consists in first obtaining the distribution of the subtraction of the critical threshold and the initial level via a deconvolution operation. Then, the cumulative distribution function of the first passage time distribution is obtained through numerical integration. A simulation study is conducted to evaluate the performance of the proposed method, where different scenarios are analyzed. Furthermore, this approach is applied to a fatigue-crack propagation case study, from which a reliability assessment is performed.es_MX
Descripción URIhttps://www.tandfonline.com/doi/abs/10.1080/16843703.2022.2146904es_MX
Idioma ISOenes_MX
Referencias físicas o lógicasProducto de investigación IITes_MX
Referencias físicas o lógicasInstituto de Ingeniería y Tecnologíaes_MX
TemaProceso gammaes_MX
TemaValor inicial aleatorioes_MX
TemaNivel critico aleatorioes_MX
Área de conocimiento CONACYTinfo:eu-repo/classification/cti/7es_MX
TítuloDegradation modeling based on the gamma process with random initial degradation level and random thresholdes_MX
Tipo de productoArtículoes_MX
Imagen repositoriohttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
Instituto (dcrupi)Instituto de Ingeniería y Tecnologíaes_MX
CosechableSies_MX
Rango de páginas1-21es_MX
Identificador DOIhttps://doi.org/10.1080/16843703.2022.2146904es_MX
CoautorMéndez-González, Luis Carlos
CoautorPerez Olguin, Ivan Juan Carlos
CoautorGarcía, Vicente
Título de revistaQuality Technology & Quantitative Managementes_MX
dc.contributor.coauthorexternoFlores Ochoa, Victor Hugo
dcrupi.impactosocialNoes_MX
dcrupi.vinculadoproyextNoes_MX
dcrupi.pronacesNingunoes_MX
dcrupi.vinculadoproyintNoes_MX


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