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dc.contributor.authorRodriguez Picon, Luis Alberto
dc.date.accessioned2023-05-16T14:46:14Z
dc.date.available2023-05-16T14:46:14Z
dc.date.issued2023-01-05es_MX
dc.identifier.urihttp://cathi.uacj.mx/20.500.11961/25588
dc.description.abstractDegradation modeling requires to consider the complexity of both the internal structure of highly reliable products and the environmental conditions, to define appropriate models to obtain estimations about the reliability and quality. These conditions reflect different sources of variability that need to be considered in the aims of obtaining accurate estimations. Although several models have been proposed in the literature, few of them consider several simultaneous sources of variability. In this paper, we propose a model based on the gamma process that considers three sources of variability, specifically in the threshold, the initial level of degradation, and in the scale parameter of the gamma process. The model considers a convolution operation of the threshold and the initial level to then be characterized via numerical integration with the gamma process with random scale. The obtained results showed that themodel can be used tomodel the degradation of products with these sources of variability, which means that it can used for case studies where both the initial level and threshold are inherently random and the randomness in the scale parameter can be proved. The performance is illustrated with a comprehensive simulation study and with the application in a case study.es_MX
dc.description.urihttps://www.mdpi.com/2073-8994/15/1/162es_MX
dc.language.isoenes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.rightsAtribución-NoComercial-SinDerivadas 2.5 México*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.5/mx/*
dc.subjectproceso gamma; Efectos aleatorios; proceso de degradación; circunvolución; fiabilidades_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleA Gamma Process with Three Sources of Variabilityes_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista1es_MX
dcrupi.volumen15es_MX
dcrupi.nopagina1-16es_MX
dc.identifier.doihttps://doi.org/10.3390/sym15010162es_MX
dc.contributor.coauthorHERNANDEZ-HERNANDEZ, JESUS
dc.contributor.coauthorMéndez-González, Luis Carlos
dc.contributor.coauthorPerez Olguin, Ivan Juan Carlos
dc.journal.titleSymmetryes_MX
dcrupi.colaboracionextgamma process; random effects; degradation process; convolution; reliabilityes_MX
dcrupi.impactosocialNAes_MX
dcrupi.vinculadoproyextNAes_MX
dcrupi.pronacesNingunoes_MX
dcrupi.vinculadoproyintNAes_MX


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