A reliability analysis for electronic devices under an extension of exponentiated perks distribution

Abstract

This paper presents a reliability analysis for electronic devices (ED) with bathtub curve-shaped failure times. An extension of the exponentiated perks distribution (EPD) is proposed for the analysis. The extension of this new distribution is based on the Alpha Power Transformation, so the Alpha Exponentiated Perks Distribution (AEXP) is introduced. The AEXP has three shape parameters and one scale parameter, allowing greater flexibility to represent failure rates in an increasing, decreasing, or bathtub curve form. Some useful properties in the reliability engineering context are presented. AEXP parameters were estimated via the Maximum Likelihood Method. Finally, two case studies focused on ED are used to compare the proposed distribution and other distributions with similar failure rate representation properties. The obtained results show that the AEXP better describes the behavior of ED than the distributions considered in the analysis.