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dc.contributor.authorRodriguez Picon, Luis Alberto
dc.date.accessioned2021-08-03T19:04:21Z
dc.date.available2021-08-03T19:04:21Z
dc.date.issued2021-04-30es_MX
dc.identifier.urihttp://cathi.uacj.mx/20.500.11961/18651
dc.description.abstractIn most degradation tests, the measuring processes is affected by several conditions that may cause variation in the observed measures. As the measuring process is inherent to the degradation testing, it is important to establish schemes that define a certain level of permissible measurement error such that a robust reliability estimation can be obtained. In this article, an approach to deal with measurement error in degradation processes is proposed, the method focuses on studying the effect of such error in the reliability assessment. This approach considers that the true degradation is a function of the observed degradation and the measurement error. As the true degradation is not directly observed it is proposed to obtain an estimate based on a deconvolution operation, which considers the subtraction of random variables such as the observed degradation and the measurement error. Given that the true degradation is free of measurement error, the first-passage time distribution will be different from the observed degradation. For the establishment of a control mechanism, these two distributions are compared using different indices, which account to describe the differences between the observed and true degradation. By defining critical levels of these indices, the reliability assessment may be obtained under a known level of measurement error. An illustrative example based on a fatigue-crack growth dataset is presented to illustrate the applicability of the proposed scheme, the reliability assessment is developed, and some important insights are provided.es_MX
dc.description.urihttps://www.mdpi.com/2076-3417/11/9/4133/htmes_MX
dc.language.isoen_USes_MX
dc.relation.ispartofProducto de investigación IITes_MX
dc.relation.ispartofInstituto de Ingeniería y Tecnologíaes_MX
dc.subjectdeconvolutiones_MX
dc.subjectgamma processes_MX
dc.subjectreliabilityes_MX
dc.subject.otherinfo:eu-repo/classification/cti/7es_MX
dc.titleReliability Analysis Based on a Gamma-Gaussian Deconvolution Degradation Modeling with Measurement Errores_MX
dc.typeArtículoes_MX
dcterms.thumbnailhttp://ri.uacj.mx/vufind/thumbnails/rupiiit.pnges_MX
dcrupi.institutoInstituto de Ingeniería y Tecnologíaes_MX
dcrupi.cosechableSies_MX
dcrupi.norevista9es_MX
dcrupi.volumen11es_MX
dcrupi.nopagina1-18es_MX
dc.identifier.doi10.3390/app11094133es_MX
dc.contributor.coauthorMéndez-González, Luis Carlos
dc.contributor.coauthorRomero Lopez, Roberto
dc.contributor.coauthorPerez Olguin, Ivan Juan Carlos
dc.contributor.coauthorRodriguez Borbon, Manuel Ivan
dc.journal.titleApplied Scienceses_MX
dc.lgacCalidad y Mejoramiento Continuoes_MX
dc.cuerpoacademicoCalidad y Optimizaciónes_MX
dc.contributor.coauthorexternoValles Rosales, Delia Julieta
dcrupi.colaboracionextEstados Unidoses_MX


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