Listar por autor "0000-0001-5545-1923"
Mostrando ítems 1-2 de 2
-
Degradation modeling based on gamma process models with random effects
Rodríguez-Picón, Luis Alberto (2018-04-01)The random effects in a gamma process are introduced in terms of its scale parameter. However, the scale parameter affects both its mean and variance. Hence, the variation of the degradation rates and the within degradation ... -
Degradation modeling of 2 fatigue-crack growth characteristics based on inverse Gaussian processes: A case study
Rodriguez Picon, Luis Alberto (2019-05-30)Most modern products that are highly reliable are complex in their inner and outer structures. This situation indicates quality characterization by the interaction of multiple performance characteristics, which motivates ...